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Tsodik LTD High-Tech Patent
TEL. +1-408-426-5657
MOBILE. +1-408-480-7634
Tech Support. +1-408-426-5657
What you know about "Chipchar??"
ChipChar Characterization key benefit:
Yield Enhancement
Design robustness checking
Fab Data Analysis
Data Sheet verification
Skew Parameters Analysis
Conference & Exhibition: October 28-30, 2008
International Test Conference, the cornerstone of TestWeek(tm), is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.
Established in 2006, Tsodik LTD is new start up company develops revolutionary innovation ChipChar Characterization Database Product for Fabless companies, Semiconductor Companies and Fabs,Test Houses, and ATE suppiers. Tsodik LTD provides also consulting services for semiconductor testing industry include high speed IC devices and wafers. The company also supply post silicon services in memory, wireless and high-speed communications:

  • Identify and create test patterns to improve test coverage and improve sort and final backend test yield.
  • Device Characterization with automated test equipment like Teradyne A5XX, Catalyst, Tiger, J750 and FLEX platforms, Verigy 83k,93k and LTX-Credence.
  • Design load boards and probe cards, correlate ATE and bench test results, develop and qualify test programs, measure repeatability, and calculate limits.
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