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What you know about "Chipchar??"
ChipChar Characterization key benefit:
Yield Enhancement
Design robustness checking
Fab Data Analysis
Data Sheet verification
Skew Parameters Analysis
Conference & Exhibition: October 28-30, 2008
International Test Conference, the cornerstone of TestWeek(tm), is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

ChipChar Demonstration

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